• Easy resistivity mapping of large sample
• 2 – way movement with vernier scales (0.01mm)
• Spring loaded contacts for firm connections

Four probe set-up for mapping the resistivity of large samples

The Four Probe Method is one of the standard and most widely used method for the measurement of resistivity. In its useful form, the four probes are collinear. The error due to contact resistance, which is significant in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistance's are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected. Because of pressure contacts, and 2 way motion, the arrangement is specially useful for quick measurement on large samples at room temperature.